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Details

Part Number NSX105 MEI
Manufacturer RUDOLPH TECHNOLOGIES
Category PRODUCTS-N
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Description

Rudolph Technologies 706765 NSX105 MEI Daughter Card Simple Type: Daughter Card

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Rudolph Technologies NSX105 MEI Daughter Card Simple Type: Control Board The NSX Series is a proven high-throughput and repeatable macro defect inspection solution used throughout the device manufacturing process. Macro defects (defects 0.5 micron and larger) can be created during wafer manufacturing, probing, bumping, dicing, or by general handling, and can have a major impact on the quality of a microelectronic device. The NSX quickly and accurately detects yield-inhibiting defects, providing quality assurance and valuable process information. This information may be transferred to Discover®, Rudolph's yield management software, for further analysis and review.

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