MSTeP-i

ETEC

Inertial MEMS test and characterization systems: Optimized for the testing and characterization of inertial MEMS, such as accelerometers, M/SteP-I incorporates a suite of high precision instruments tailored to inertial testing applications. All the resources necessary to interface to electrodynamic shakers, thermal chambers, and material handlers are included. An Inertial Stimulus Package includes the shaker I/O for interfacing to the electrodynamic shaker and the reference accelerometer. Simple Type: SPECIALTY PRODUCT

CONB-119

ETEC

ETEC CONB-119 ETEC Test Box Module 0753-5100-009 working Simple Type: NYC

BE2-020-S131-11

ETEC

Etec BE2-020-S131-11 Mating Connector Simple Type: Mating Connector

8035-0080-000W

ETEC

ETEC 8035-0080-000W ETEC 8035-0080-000W Gauge Kit refurbished Simple Type: NYC

8032-0533-010

ETEC

ETEC 8032-0533-010 ETEC Systems 8032-0533-010 Water Drawer Assembly Type II refurbished Simple Type: NYC