APPLIED TEST RESOURCES » MTS-2010i
Details
| Part Number | MTS-2010i |
|---|---|
| Manufacturer | APPLIED TEST RESOURCES |
| Category | PRODUCTS-M |
| Price | Request Quote |
| Lead Time | Request Quote |
Description
Cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process Simple Type: SPECIALTY PRODUCT
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Specifications
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Datasheet
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