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Part Number Manufacturer Description Brand Price & Lead Time
20702A RUDOLPH TECHNOLOGIES Rudolph Technologies 20702A Rudolph Technologies 20702A Lock-In Amplifier PCB working Simple Type: NYC Request Quote
706765 RUDOLPH TECHNOLOGIES Rudolph Technologies 706765 Daughter Card Simple Type: Daughter Card Request Quote
MetaPulse 200 RUDOLPH TECHNOLOGIES Rudolph Technologies MetaPulse 200 Rudolph Technologies 200mm MetaPulse 200 Parts Tool as-is Simple Type: NYC Request Quote
NSX105 RUDOLPH TECHNOLOGIES Rudolph Technologies NSX105 MEI Daughter Card Simple Type: Control Board The NSX Series is a proven high-throughput and repeatable macro defect inspection solution used throughout the device manufacturing process. Macro defects (defects 0.5 micron and larger) can be created during wafer manufacturing, probing, bumping, dicing, or by general handling, and can have a major impact on the quality of a microelectronic device. The NSX quickly and accurately detects yield-inhibiting defects, providing quality assurance and valuable process information. This information may be transferred to Discover®, Rudolph's yield management software, for further analysis and review. Request Quote
NSX105 MEI RUDOLPH TECHNOLOGIES Rudolph Technologies 706765 NSX105 MEI Daughter Card Simple Type: Daughter Card Request Quote