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Disk Inspection Systems JMAR PRECISION SYSTEMS (DIS) Inspection differs from measurement in that the results of the process are qualitative rather than quantitative. These systems are designed to look for defects such as contamination, chips, scratches, stains, discoloration, and other flaws. Defect inspection may be as simple as presenting the site of a potential defect to an operator for evaluation, or as sophisticated as using an image processor to automatically detect and categorize defects on a part Simple Type: SPECIALTY PRODUCT Request Quote