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Odyssey HPL Production proven defect data management solution that is in use at over eighty manufacturing sites worldwide. Odyssey-Defect delivers results efficiently and reliably, leveraging error-correcting processes to assure users of maximum up time. Odyssey has an open and vendor-neutral architecture that supports all inspection, review and classification tools with a full range of charting, wafer mapping, and reporting. Simple Type: SPECIALTY PRODUCT Request Quote